| Title | Metallization Failures |
|---|---|
| Record ID | 49539 |
| Personal Name Creator |
Beatty, Rosemary |
| Corporate Creator | John A. Volpe National Transportation Systems Center (U.S.) |
| Corporate Contributor |
United States. National Aeronautics and Space Administration |
| Publisher | United States. National Aeronautics and Space Administration |
| Publication Date | 19710501 |
| Language | English |
| Abstract | Metallization-related failure mechanisms are a major cause of integrated circuit failures under accelerated stress and field operations conditions. |
| Rosap ID | dot:38915 |
| Rosap URL | https://rosap.ntl.bts.gov/view/dot/38915 |
| TRT Terms | Integrated circuits; Metal working; Cold working |
| Geographical Coverage |
United States |
| TRIS Online Accession No |
1701345 |
| Report Number | DOT-TSC-NASA-71-9 |
| Resource type | Tech Report |
| URL | https://ntlrepository.blob.core.windows.net/lib/49000/49500/49539/DOT-TSC-NASA-71-9.pdf |
| Format | |
| Database | NTL Digital Repository |